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Electronics Test

Planning for ATE Success at NIDays

January 13, 2015

Bloomy supported the automated test community with informative presentations and practical exhibits at NIDays North America conferences late in 2014.  Turnkey Systems Manager Grant Gothing presented “Plan for Success with Automated Test” to standing-room-only crowds who learned best practices for creating test requirements, specifying instrumentation, defining interconnects, and selecting the right software architecture.

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In-Circuit vs. Functional Test

September 11, 2014

As manufacturing processes improve and circuitry has moved from discrete components to highly-integrated programmable components, effective test strategies must now place more emphasis on functional test rather than in-circuit test (ICT).

In-circuit test performs a “schematic verification” by testing individual components of a printed circuit board (PCBA) one at a time by comparison against a software model of some parameters of the component. It is not done “at speed” and does not verify interoperability but is very effective at finding manufacturing defects.

ICT excels at:

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ATE Best Practices Presentation

August 14, 2014

Bloomy had a strong presence at NIWeek 2014, with the biggest Alliance Partner booth that included an engaging bicycle generator that hundreds tested their stamina on, as well as many presentations by Bloomy staff in various conference tracks. 

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