Location
This year at the Bloomy pavilion, booth #205 of the exhibition hall, Bloomy will showcase four innovative product demonstrations:
NI HIL Simulator Concept System
BMS HIL Test System
UTS Functional Tester
cUTS Functional Tester
In addition, Bloomy will present the following technical sessions at this year's event:
From the Experts: Improving ATE Test Sequence Adaptability Using HALs and MALs
Technical Session: 9890
Date & Location: Tuesday, August 2nd @ 2:15-2:45 pm, Room 12A
Session Length: 60 min.
Presented by: ATE Business Unit Manager, Grant Gothing
Advanced Battery Testing Trends and Technologies
Technical Session: 9923
Date & Location: Wednesday, August 3rd @ 11:00-11:30 am, Ballroom G
Session Length: 30 min.
Presented by: Bloomy President, Peter Blume
Test Challenges and Solutions for Advanced Battery Management System Test
Technical Session: 9903
Date & Location: Wednesday, August 3rd @ 4:45-5:15 pm, Ballroom E
Session Length: 30 min.
Presented by: BTS Business Unit Manager, Steven Hoenig
Creating Effective User Experiences in LabVIEW™ Applications
Technical Session: 9636
Date & Location: Thursday, August 4th @ 10:30-11:30 am, Room 16A
Session Length: 60 min.
Presented by: Project Engineer, James (Ryan) Vallieres
As the Tuesday Expo hours begin to wind down, wind back up again with our yo-yo trick contest from 7:00-7:30 pm. The winner will receive a Fitbit.
For additional details on Bloomy's participation at NIWeek 2016, please read our news release.